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SUMMARY:Magnetoresistive Stacks with Improved Thermal Resilience
DTSTART:20250926T140000Z
DTEND:20250926T160000Z
DTSTAMP:20260809T165815Z
UID:e5efa8f8-be81-456a-972d-fd84c39446ba
SEQUENCE:2
CREATED:20250912T095928Z
DESCRIPTION:Magnetic sensors are widely used in state-of-the-art electroni
 cs and play a crucial role in industrial applications. These sensors act a
 s transducers between magnetic fields and electrical currents and are requ
 ired to have exceptional performance even in harsh environments. The desig
 n of each thin film component is essential to ensure that these technologi
 es remain competitive for next-generation applications. The unidirectional
  reference of the sensors is typically established through exchange coupli
 ng in antiferromagnetic/ferromagnetic bilayers. This work explores the use
  of two different antiferromagnets (MnIr and MnNi) to enhance the thermal 
 stability of tunnel magnetoresistive devices. The growth conditions and th
 e seed layers (Ta\, Ru\, CuN)\, were modified to produce thermally stable 
 structures compatible with operation in harsh environments. Additionally\,
  the stability of tunnel magnetoresistive sensorsto magnetic fields was an
 alyzed for applications as angular sensors. Different synthetic antiferrom
 agnets were studied\, along with their impact on the angular performance o
 f the devices. Magnetic anisotropies and interlayer couplings were investi
 gated using a macrospin model\, which allowed the definition of material l
 imits to minimize device output errors. Subsequently\, the electrical char
 acterization of microfabricated sensors contributed to the understanding o
 f the operational limits and verification the applicability of the develop
 ed model. Finally\, this work explored a new way to tune the linear range 
 of magnetic sensors (anisotropic and tunnel magnetoresistive sensors) usin
 g magnetic antidot structures. When applied to the ferromagnetic layers of
  the sensors\, this methodology enabled the control to the linear region o
 f such devices and modifications to their sensitivity at device/wafer leve
 l. This work demonstrates several strategies that can be used to improve s
 pintronic sensing technologies and extend their operational limits. The re
 sults are shown to leverage the design of robust sensors targeting harsh e
 nvironment applications.
LAST-MODIFIED:20250912T095950Z
LOCATION:Anfiteatro PA-3 (Piso -1 do Pavilhão de Matemática) do IST
URL:http://df.vps.tecnico.ulisboa.pt/pt/eventos/magnetoresistive-stacks-wi
 th-improved-thermal-resilience/
X-ALT-DESC;FMTTYPE=text/html:<p data-block-key="5zz8i">Magnetic sensors ar
 e widely used in state-of-the-art electronics and play a crucial role in i
 ndustrial applications. These sensors act as transducers between magnetic 
 fields and electrical currents and are required to have exceptional perfor
 mance even in harsh environments. The design of each thin film component i
 s essential to ensure that these technologies remain competitive for next-
 generation applications. The unidirectional reference of the sensors is ty
 pically established through exchange coupling in antiferromagnetic/ferroma
 gnetic bilayers.<br/><br/> This work explores the use of two different ant
 iferromagnets (MnIr and MnNi) to enhance the thermal stability of tunnel m
 agnetoresistive devices. The growth conditions and the seed layers (Ta\, R
 u\, CuN)\, were modified to produce thermally stable structures compatible
  with operation in harsh environments. Additionally\, the stability of tun
 nel magnetoresistive sensorsto magnetic fields was analyzed for applicatio
 ns as angular sensors. Different synthetic antiferromagnets were studied\,
  along with their impact on the angular performance of the devices.<br/><b
 r/> Magnetic anisotropies and interlayer couplings were investigated using
  a macrospin model\, which allowed the definition of material limits to mi
 nimize device output errors. Subsequently\, the electrical characterizatio
 n of microfabricated sensors contributed to the understanding of the opera
 tional limits and verification the applicability of the developed model. F
 inally\, this work explored a new way to tune the linear range of magnetic
  sensors (anisotropic and tunnel magnetoresistive sensors) using magnetic 
 antidot structures.<br/><br/> When applied to the ferromagnetic layers of 
 the sensors\, this methodology enabled the control to the linear region of
  such devices and modifications to their sensitivity at device/wafer level
 . This work demonstrates several strategies that can be used to improve sp
 intronic sensing technologies and extend their operational limits. The res
 ults are shown to leverage the design of robust sensors targeting harsh en
 vironment applications.</p>
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